Calibration of force using the atomic force microscope

Project description

The atomic force microscope (AFM) can be used to image surfaces with nanometre resolution but can also measure surface forces and mechanical properties of samples. In order to acquire quantitative force data there are a number of components of the AFM system that must be calibrated accurately. These include the cantilever spring constant (stiffness), cantilever sensitivity (deflection) and  z-height of the scanner. There has been a number of methods developed to determine these components, with the spring constant of the cantilever receiving the greatest attention. While progress has been made there are a number of factors that still require investigation including, for example, the calibration of stiff cantilevers (greater than 20 N/m) and the application of the thermal noise method to the cantilever sensitivity. This project will involve the development of methods to calibrate force and the application of these techniques to the measurement of the material properties of various polymers, including recently developed sulfur polymers.

Assumed knowledge

Physics, Physical Chemistry, Nanotechnology

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